Functions and Features of the Electronic Rotating Probe
Release date:
2022-07-19
An electron microprobe is an instrument that employs the characteristic X-rays generated by these electron beams to perform micro‑area compositional analysis [1], and it can be used to determine the chemical composition of mineral micro‑areas in thin sections. With the exception of a few light elements such as H, He, Li, and Be, as well as elements heavier than U, it is capable of both qualitative and quantitative analyses. Many electron microprobes utilize an extremely narrow, accelerated and focused electron beam as the probe; this beam excites a small region of the sample to emit characteristic X-rays, and the wavelength and intensity of these X-rays can then be measured.
Electronic Rotating probe It is an instrument that employs characteristic X-ray techniques generated by these electron beams to perform micro‑area compositional analysis, enabling the determination of the chemical composition of mineral micro‑areas within thin sections. With the exception of a few light elements such as H, He, Li, and Be, as well as elements heavier than U, it can carry out both qualitative and quantitative analyses. Many electron probe microanalyzers use an extremely narrow, accelerated and focused electron beam as a probe to induce the emission of characteristic X-rays from a small region of the sample, allowing for the measurement of X-ray wavelength and intensity to perform qualitative or quantitative elemental analysis of the micro‑area.
Electronic Rotating probe Functions and features
The electron microprobe can perform qualitative or quantitative analysis of the chemical composition of minute regions (on the micrometer scale) within a sample. It supports point‑scan, line‑scan (to obtain information on layer‑by‑layer compositional profiles), and area‑scan analyses (to generate images of compositional surface distributions). It also enables automated batch quantitative analyses, with up to 9,999 pre‑defined test points. Thanks to its practical advantages—rapid and straightforward operation, intuitive interpretation of experimental data, nondestructive analysis, and high measurement accuracy—electron microprobe technology has been widely adopted in metallurgy, geology, electronic materials, and biology, as well as in fields such as medicine and archaeology. It is an essential tool for mineralogical testing and sample‑composition analysis.
Electronic Rotating probe Main uses
The electron‑scanning probe is also known as a micro‑area X‑ray spectrometer or an X‑ray microanalyzer. Its principle involves directing a focused, high‑energy electron beam onto the surface of a solid material, causing the bombarded elements to emit characteristic X‑rays. By analyzing the wavelength and intensity of these X‑rays, one can perform qualitative and quantitative chemical analyses of microscopic regions on the solid’s surface. It is primarily used to analyze small particles or tiny areas on solid surfaces, with a minimum detectable diameter of approximately 1 μm. The range of elements that can be analyzed spans atomic numbers from 3 (lithium) to 92 (uranium), and the detection limit for elemental concentrations can reach as low as 10⁻¹⁴ to 10⁻¹⁵ grams. In recent years, a combined control system integrating scanning electron microscopy and microanalysis has been developed, enabling simultaneous observation of microstructural morphology and point‑by‑point comparative analysis of the sample’s chemical composition and structure. This technique is widely employed in fields such as geology, metallurgical materials science, and cement clinker research.
Electronic Rotating probe Structural characteristics
The electron‑controlled probe X‑ray microanalyzer (commonly referred to as the Chinese Electron Probe) employs a finely focused electron beam with a spot size on the order of 1 pm to excite characteristic X‑rays from elemental species in localized regions on the sample surface, enabling qualitative and quantitative compositional analysis based on the wavelengths and intensities of these X‑ray signals. The electron probe’s optical system, vacuum system, and other components are largely similar to those of a scanning electron microscope; it is typically equipped with detectors for secondary electrons and backscattered electrons. In addition to the main unit—whose structure closely resembles that of a scanning electron microscope—the electron probe comprises key subsystems such as the spectrometry system and the detection‑and‑data‑acquisition system.
Electronic Rotating probe It consists primarily of an electron-optical system (the column), an X-ray spectrometer, and an information recording and display system. The electron probe and the scanning electron microscope share essentially the same electron-optical architecture and are often integrated into a single instrument.
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