Common Questions and Answers About Test Probes
Release date:
2021-05-13
Common Questions and Answers About Test Probes
Q: Does the spring of the test probe need to be electroplated?
A: As is well known, a standard test needle consists of three parts: the needle tip, the needle tube, and the spring. While everyone can see the needle and the outer tube, the spring inside remains invisible.
The spring of a test probe is a critical factor determining its service life. To cut costs, many probe manufacturers choose not to electroplate the springs of their test probes. This is precisely why it is so important to consider how the spring affects the probe’s lifespan.
Electroplated springs boast a long service life and are resistant to rust, significantly enhancing the durability and conductivity of test probes.
Q: What is the principle behind the test needle?
A: The principle of the test probe is as follows: the probe serves as the medium. The probe is placed within a housing, with its tip making contact with the device under test; a wire at the opposite end of the housing carries the signal, which is then processed by the tester. For example, when testing a resistor, a current source is used to measure the voltage drop across the probe; for a capacitor, a constant‑voltage source is employed to determine the slope of the charging curve at various frequencies. This type of probe is designed for continuous use during manufacturing and is relatively inexpensive, which is why it has become widely adopted in the testing community.
There are many types of probes. The shapes of the probe tips vary primarily because different test points require different tip geometries. For example, immersion probes use multi‑claw tips, pad‑test points employ pointed, round, or flat tips, and IC pins are tested with plum‑blossom‑shaped tips, among others. Selecting the appropriate tip requires experienced production personnel to match it to the components on the finished PCB.
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